Cover of the work “Methods and means for predicting and ensuring the resistance of ferroelectric memory devices to the effects of radiation factors”. Author: Orlov, Andrey Aleksandrovich. Degree: Candidate of Sciences. Year: 2012

Methods and means for predicting and ensuring the resistance of ferroelectric memory devices to the effects of radiation factors

National Research Nuclear University, Moscow

134 pp.

Methods and means for predicting and ensuring the resistance of ferroelectric memory devices to the effects of radiation factors — Orlov, Andrey Aleksandrovich — 2012 — Russian Dissertation Library