Cover of the work “Laser methods for evaluating the resistance of CMOS VLSI circuits to thyristor effects under the impact of individual nuclear particles”. Author: Pechenkin, Aleksandr Aleksandrovich. Degree: Candidate of Sciences. Year: 2012

Laser methods for evaluating the resistance of CMOS VLSI circuits to thyristor effects under the impact of individual nuclear particles

National Research Nuclear University, Moscow

126 pp.

Laser methods for evaluating the resistance of CMOS VLSI circuits to thyristor effects under the impact of individual nuclear particles — Pechenkin, Aleksandr Aleksandrovich — 2012 — Russian Dissertation Library