Cover of the work “Methods and means for modeling and evaluating the radiation hardness of flash memory chips”. Author: Vasiliev, Aleksei Leonidovich. Degree: Candidate of Sciences. Year: 2010

Methods and means for modeling and evaluating the radiation hardness of flash memory chips

National Research Nuclear University, Moscow

142 pp.

Keywords

flash memory chips

Methods and means for modeling and evaluating the radiation hardness of flash memory chips — Vasiliev, Aleksei Leonidovich — 2010 — Russian Dissertation Library