Cover of the work “Two-phase elements of submicron CMOS digital VLSI circuits with increased immunity to soft errors induced by individual nuclear particles”. Author: Ol'chev, Sergei Ivanovich. Degree: Candidate of Sciences. Year: 2011

Two-phase elements of submicron CMOS digital VLSI circuits with increased immunity to soft errors induced by individual nuclear particles

National Research Nuclear University, Moscow

184 pp.

Two-phase elements of submicron CMOS digital VLSI circuits with increased immunity to soft errors induced by individual nuclear particles — Ol'chev, Sergei Ivanovich — 2011 — Russian Dissertation Library