Infrared Fourier spectroscopy of semiconductor structures with thin layers (InGaAs/GaAs, PbSnSe/BaF2, porous silicon)

Saint Petersburg

128 pp.

Infrared Fourier spectroscopy of semiconductor structures with thin layers (InGaAs/GaAs, PbSnSe/BaF2, porous silicon) — Kholodilov, Andrei Nikolaevich — 1995 — Russian Dissertation Library