Diagnostics of large-scale impurity clusters in semiconductors and analysis of such clusters in Czochralski-grown siliconMurin, Dmitriy Igorevich, 1996, Candidate of Sciences dissertation01.04.10 Semiconductor physicsMoscow129 pp.Keywordssemiconductors, silicon, Czochralski methodMore works in this specialtyDissertationEffect of dielectric thickness nonuniformity on the properties of tunnel MOS structures Al/(1-4 nm)SiO2/SiTyaginov, Stanislav Eduardovich · 2006 · Candidate of Sciences01.04.10 Semiconductor physicsDissertationStructure and electrophysical properties of tellurium crystals and the Te80Si20 alloy obtained at different gravity levelsYakimov, Sergey Vladimirovich · 2005 · Candidate of Sciences01.04.10 Semiconductor physicsDissertationTheory of photoelectric phenomena due to the absence of central symmetry of the mediumEntin, Matvei Vulfovich · 2005 · Doctor of Sciences01.04.10 Semiconductor physicsDissertationKinetics of atomic transformations of a crystalline surface during epitaxial growth and accompanying processes (simulation)Yanovitskaya, Zoya Shmerovna · 2003 · Doctor of Sciences01.04.10 Semiconductor physicsDissertationOptical properties and structure of amorphous carbonYastrebov, Sergey Guryevich · 2003 · Doctor of Sciences01.04.10 Semiconductor physicsAll works in this specialty