Cover of the work “Diagnostics of device structures based on silicon and carbon layers by Raman scattering spectroscopy”. Author: Levitsky, Vladimir Sergeevich. Degree: Candidate of Sciences. Year: 2016

Diagnostics of device structures based on silicon and carbon layers by Raman scattering spectroscopy

Saint Petersburg State Electrotechnical University "LETI", Saint Petersburg

126 pp.

Diagnostics of device structures based on silicon and carbon layers by Raman scattering spectroscopy — Levitsky, Vladimir Sergeevich — 2016 — Russian Dissertation Library