Cover of the work “Development of capacitive methods for measuring doping profiles of semiconductor structures”. Author: Utkin, Aleksey Borisovich. Degree: Candidate of Sciences. Year: 1999

Development of capacitive methods for measuring doping profiles of semiconductor structures

Saint Petersburg

155 pp.

Development of capacitive methods for measuring doping profiles of semiconductor structures — Utkin, Aleksey Borisovich — 1999 — Russian Dissertation Library