Russian Dissertation Library
Cover of the work “X-ray diffractometry of the real structure of single crystals and epitaxial layers based on two-dimensional intensity analysis”. Author: Kyutt, Reginald Nikolaevich. Degree: Doctor of Sciences. Year: 1995

X-ray diffractometry of the real structure of single crystals and epitaxial layers based on two-dimensional intensity analysis

Kyutt, Reginald Nikolaevich, 1995, Doctor of Sciences dissertation

Saint Petersburg

440 pp.

Keywords

X-ray diffractometry

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X-ray diffractometry of the real structure of single crystals and epitaxial layers based on two-dimensional intensity analysis — Kyutt, Reginald Nikolaevich — 1995 — Russian Dissertation Library