Cover of the work “Techniques for experimental investigation of multiple upsets in CMOS static random-access memory integrated circuits under the action of individual nuclear particles”. Author: Boruzdina, Anna Borisovna. Degree: Candidate of Sciences. Year: 2014

Techniques for experimental investigation of multiple upsets in CMOS static random-access memory integrated circuits under the action of individual nuclear particles

National Research Nuclear University, Moscow

121 pp.

Keywords

exposure to nuclear particles

Techniques for experimental investigation of multiple upsets in CMOS static random-access memory integrated circuits under the action of individual nuclear particles — Boruzdina, Anna Borisovna — 2014 — Russian Dissertation Library