Cover of the work “Resonant microwave methods for multiparameter measurements of epitaxial semiconductor structures with nanometer metal layers”. Author: Latysheva, Ekaterina Viktorovna. Degree: Candidate of Sciences. Year: 2016

Resonant microwave methods for multiparameter measurements of epitaxial semiconductor structures with nanometer metal layers

Saratov State University named after N. G. Chernyshevsky, Saratov

127 pp.

Resonant microwave methods for multiparameter measurements of epitaxial semiconductor structures with nanometer metal layers — Latysheva, Ekaterina Viktorovna — 2016 — Russian Dissertation Library