Cover of the work “Methods and means for studying radiation effects in integrated circuits of memory devices using local exposure”. Author: Yanenko, Andrey Viktorovich. Degree: Candidate of Sciences. Year: 2009

Methods and means for studying radiation effects in integrated circuits of memory devices using local exposure

Moscow State Engineering Physics Institute, Moscow

146 pp.

Methods and means for studying radiation effects in integrated circuits of memory devices using local exposure — Yanenko, Andrey Viktorovich — 2009 — Russian Dissertation Library