Cover of the work “Investigation of the local characteristics of semiconductor structures by the surface electron-induced potential method in scanning electron microscopy”. Author: Zhu Shiqu. Degree: Candidate of Sciences. Year: 2001

Investigation of the local characteristics of semiconductor structures by the surface electron-induced potential method in scanning electron microscopy

Moscow

172 pp.

Investigation of the local characteristics of semiconductor structures by the surface electron-induced potential method in scanning electron microscopy — Zhu Shiqu — 2001 — Russian Dissertation Library