Investigation of electrically active and recombination-active defects in silicon and silicon-germanium alloys by the mapping method of small-angle light scattering

Moscow

96 pp.

Keywords

mapping method, small-angle light scattering

Investigation of electrically active and recombination-active defects in silicon and silicon-germanium alloys by the mapping method of small-angle light scattering — Astafiev, Oleg Vladimirovich — 1997 — Russian Dissertation Library