Cover of the work “Investigation and development of methods for modeling the characteristics of integrated circuits under radiation exposure”. Author: Zolnikov, Vladimir Konstantinovich. Degree: Doctor of Sciences. Year: 1998

Investigation and development of methods for modeling the characteristics of integrated circuits under radiation exposure

Voronezh

283 pp.

Investigation and development of methods for modeling the characteristics of integrated circuits under radiation exposure — Zolnikov, Vladimir Konstantinovich — 1998 — Russian Dissertation Library