Cover of the work “Development of the ellipsometry method for studying nanoscale films of dielectrics, semiconductors, and metals”. Author: Svitasheva, Svetlana Nikolayevna. Degree: Doctor of Sciences. Year: 2014

Development of the ellipsometry method for studying nanoscale films of dielectrics, semiconductors, and metals

Budker Institute of Nuclear Physics of the Siberian Branch of the RAS, Novosibirsk

338 pp.