Analysis of the key characteristics of methods for local diagnostics of semiconductors: the X-ray beam induced current method and the X-ray fluorescence method

More works in this specialty

1. Evolution of defect structures in the nanometer surface layer of a solid under various external influences

   Knyazev, Sergey Aleksandrovich · Doctor of Sciences · Saint Petersburg State University

   • 01.04.07 Condensed-matter physics
2. Electron and vortex transport in superconducting titanium nitride films

   Postolova, Svetlana Vladimirovna · Candidate of Sciences · Rzhanov Institute of Semiconductor Physics of the Siberian Branch of the Russian Academy of Sciences

   • 01.04.07 Condensed-matter physics
3. Modeling of the deformation behavior of bulk nanostructured metallic materials

   Chemberisova, Roza Galievna · 2014 · Doctor of Sciences · Institute of Physics of Molecules and Crystals of the Ufa Scientific Center of the Russian Academy of Sciences

   • 01.04.07 Condensed-matter physics
4. Electronic structure and radiation-optical properties of lead-silicate glasses

   Zhidkov, Ivan Sergeevich · 2014 · Candidate of Sciences · Ural Federal University named after the First President of Russia B.N. Yeltsin

   • 01.04.07 Condensed-matter physics
5. Dissipative structures and processes in the formation of functional materials based on carbon nanotubes

   Zhukalin, Dmitriy Alekseevich · 2014 · Candidate of Sciences · Voronezh State University

   • 01.04.07 Condensed-matter physics

All works in this specialty